Measurement of low temperature radiative properties of materials
- Emissivity at temperatures from 20K to 300K
- Absorptivity of material at temperature above 4.5K with respect to the radiation of temperature
TR= 20K to 300K
 Principle of measurement |
 Apparatus |
 Measurement chamber (sample diam. 40 mm) |
 Vacuum casing tube with apparatus in LHe Dewar |
 Chemically polished Cu sample |
|
 Emissivity and absorptivity of copper |
 Map of skineffect – Cu |